Inspection

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  • Semiconductor
  • 3C Electronics
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Detect whether the wafers are placed accurately

Check whether the wafer placement is accurate

Measure wafer thickness and flatness

Measuring thickness and flatness of wafer.

Check whether the chip is flat or not

The tiny optical fiber can detect the warpage of the tiny chip. The narrow beam projected from the ultra-fine fiber core can identify subtle changes.

Sectors Filter

  • Semiconductor
  • 3C Electronics
  • Package
  • Automobiles
  • logistics
  • New energy
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